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resolution test chart  (Thorlabs)

 
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    Thorlabs resolution test chart
    Resolution Test Chart, supplied by Thorlabs, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/result/resolution test chart/product/Thorlabs
    Average 86 stars, based on 1 article reviews
    resolution test chart - by Bioz Stars, 2026-05
    86/100 stars

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    Reconstructed object phase from the 12‐beam measurement of the Siemens <t>star</t> <t>test</t> pattern at 13 keV; a) overall image, colored squares represent regions irradiated by each individual beam respectively; b) magnified central region partially scanned by two neighboring probes; c) magnified region with smallest features—50 nm, red line indicates the position for the line profile; d) line profile of the edge estimating <t>resolution;</t> The color bar represents phase shift in radians. The pixel size in reconstruction is 8 nm.
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    Image Search Results


    Reconstructed object phase from the 12‐beam measurement of the Siemens star test pattern at 13 keV; a) overall image, colored squares represent regions irradiated by each individual beam respectively; b) magnified central region partially scanned by two neighboring probes; c) magnified region with smallest features—50 nm, red line indicates the position for the line profile; d) line profile of the edge estimating resolution; The color bar represents phase shift in radians. The pixel size in reconstruction is 8 nm.

    Journal: Advanced Science

    Article Title: X‐Ray Multibeam Ptychography at up to 20 keV: Nano‐Lithography Enhances X‐Ray Nano‐Imaging

    doi: 10.1002/advs.202310075

    Figure Lengend Snippet: Reconstructed object phase from the 12‐beam measurement of the Siemens star test pattern at 13 keV; a) overall image, colored squares represent regions irradiated by each individual beam respectively; b) magnified central region partially scanned by two neighboring probes; c) magnified region with smallest features—50 nm, red line indicates the position for the line profile; d) line profile of the edge estimating resolution; The color bar represents phase shift in radians. The pixel size in reconstruction is 8 nm.

    Article Snippet: [ ] A Siemens star resolution test chart sample was again taken as an initial measurement at 20 keV.

    Techniques: Irradiation

    Reconstructed object phase from the 6 beam measurement of the Siemens star test pattern at 20 keV; a) overall image; b) magnified central region; c) line edge profile estimating resolution. The pixel size in reconstruction is 44 nm.

    Journal: Advanced Science

    Article Title: X‐Ray Multibeam Ptychography at up to 20 keV: Nano‐Lithography Enhances X‐Ray Nano‐Imaging

    doi: 10.1002/advs.202310075

    Figure Lengend Snippet: Reconstructed object phase from the 6 beam measurement of the Siemens star test pattern at 20 keV; a) overall image; b) magnified central region; c) line edge profile estimating resolution. The pixel size in reconstruction is 44 nm.

    Article Snippet: [ ] A Siemens star resolution test chart sample was again taken as an initial measurement at 20 keV.

    Techniques: